Topography and anchoring

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Project objective

Coated surfaces show specific properties for liquid crystals anchoring. Glass surfaces coated with SiO by evaporation have already been studied and phase diagram of '5CB' tilt angle already been established. However, microscopic mechanisms responsible for this anchoring are still unknown but they are expected to be linked to the nature of the substrate (glass, silicon...). We have already per- formed some preliminary ellipsometric measurements (Collhge de France) on '5CB' spreading on silicon wafers : in contact with the surface, molecules seem to be ver- tical (o = O rad) while macroscopically, we measure a tilt angle close to o = r/2 ! The aim of the project is to get more information about this phenomenon by varying the relevant parameters of the surface : evaporation angle of incidence, SiO thickness deposited (i.e. roughness, surface polarisability...). We intent to characterize the Si/SiO rough surfaces by AFM using fractal programmes being developed at the University of Calabria. In parallel, anchoring will be measured by way of reflective microscopy in order to obtain the phase dia- gram of tilt angle on silicon wafers. This work will be connected with ellipsometric measurements.

Original text from CORDIS.

Participants

• UNIVERSITA DEGLI STUDI DELLA CALABRIA · RENDECoordinatorItaly
• Not availableCity levelFrance

Links

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