HCI · Investigation of sputter-induced surface nano-structuring by highly charged ions (HCI)

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Project objective

We investigate secondary particle emission phenomena after ion-surface collisions of HCIs combining imaging- TOF- and laser-induced post-ionisation techniques. By measuring double differential sputtering yields information about energy deposition in nano-structuring processes is gained.

Original text from CORDIS.

Participants

• N/ACoordinatorCity levelUnknown Region

Links

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