OCMFMEMSM · Optical characterisation methods for micro-electro- mechanical systems manufacturing: implementing and calibration of an in situ integrated technique

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Project objective

While MEMS manufacturing is impressively progressed during the last decade, tools for testing of mechanical properties of microstructures are not very well-developed and not suited for MEMS technology. The proposed programme aims at strengthening MEMS testability using optical on-chip integrated techniques based on MEMS interrogation by integrated interferometry. This testability has to play an important role, both during design and development of micromechanical structures and during chip-production.Thus, the stress of a deposited thin films can be obtained from measurements by an integrated interrogation system based on Mach-Zehnder interferometry where one of the branches of this interferometer is rigid the other one is made on top of a piezoelectically actuated membrane. When the piezoelectric actuation is applied to the membrane, the Mach-Zehnder output signals contain the information about the optical path change of the sensing arm produced by membrane deformations.

Original text from CORDIS.

Participants

• UNIVERSIT_ DE FRANCHE-COMT_ · BESAN_ONCoordinatorCountry levelFrance

Links

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