H2020Индивидуална стипендия2020–2022

STMICRO · Space-time visualization of microelectronic chip operation with femtosecond electron microscopy

„Хоризонт 2020“ — Действия „Мария Склодовска-Кюри“

Период: 2020-04-01 → 2022-04-30
Финансиране от ЕС: 162 806 €
Участници: 1
Схема: MSCA-IF-EF-ST

Линиите свързват координатора с партньорите.

Накратко на български

Движението на електроните в микрочиповете се наблюдава чрез ултрабърза електронна микроскопия с лазери. Това помага за разработването на по-бърза електроника и следващите поколения комуникации, като 6G.

Този кратък обзор е генериран от изкуствен интелект

Кратко обяснение, генерирано от езиков модел по текста на CORDIS. Оригиналът е по-долу.

Резултати накратко

Space-time visualization of microelectronic chip operation with femtosecond electron microscopy

Addressed problem: Information processing by modern microelectronic circuits relies on ever-smaller and ever-faster components. The foreseen time (femtosecond) and spatial (nanometer) scales of electronic components surpass the capability of modern diagnostic tools. Thus, research and development of smaller and faster electronics, is restricted by our inability to see and measure electron dynamics in semiconductor chips at sufficient resolution in time and space. Ultimately, a novel approach is required, that would offer a superior resolution, that cannot be provided by electronics itself. A combination of laser technology and electron microscopy, called ultrafast electron microscopy, can satisfy both spatial and temporal demands. Form these fundamental considerations it follows that ultrafast electron microscopy is the enabling technology for the research and development of semiconductor chips for the years to come. Importance for society: The EC Horizon 2020 program points out that nanoelectronic devices are the “key Enabling Technologies driving the Europe’s growth and competitiveness” and “essential building blocks in addressing societal challenges”. A novel principle for the diagnostics of fastest electronic circuits therefore has a far-reaching potential, facilitating the development of next-generation (6G and beyond) telecommunication and electronics in general. Overall objectives: Electron microscopy and laser technology are in the Ultrafast Electron Microscope (UEM). The UEM allows to visualize atoms and electrons in motion on their natural time and length scales. Here, UEM is used to investigate fundamental electron transport and in operando diagnostics elementary microelectronic devices. The overall research objective of the proposal is to use femtosecond electron pulses to probe rapidly switching electric fields in microelectronic structures. Conclusions of the action: A proof-of-principle method for investigation the dynamics of electrons and electromagnetic fields in microelectronic structures is demonstrated with femtosecond, micrometer and millivolt resolution (M. Volkov et al., manuscript in preparation, 2022). A platform for characterizing electron pulses interacting with terahertz transients is devised, providing sub-femtosecond time resolution (M. Volkov et al., https://doi.org/10.48550/arXiv.2206.13805). Further exploration of ultrafast electronics with electron microscopy tools will be continued by the fellow in the next career steps.

Текст от CORDIS, на английски · Данни: CORDIS, © Европейски съюз

Цел на проекта

Progress in modern information processing relies on the combination of a few-nanometer structures with ever-increasing signal speeds approaching the terahertz (THz) level and beyond. However, the design of such devices is currently restricted by our inability to see and measure the underlying charge carrier dynamics at sufficient resolution in time and space. This proposal aims at solving this problem by combining femtosecond laser technology with electron microscopy for achieving sub-nanometer and multi-THz space-time resolution of electromagnetic fields and charge motion in future microelectronic devices. It relies on the recently demonstrated technique of electron pulse compression down to femtoseconds by means of optical radiation. Electron pulses can capture the electric fields in structures as small as atoms at an instant of time. While conventional electron microscopy is the main tool allowing to see modern nanometer-sized electronic components, it can only sense the structure of devices and not how they operate dynamically. In contrast, femtosecond electron microscopy allows to resolve THz dynamics. Here, in order to drive microelectronic components at THz frequencies, laser-generated THz pulses will be used. Furthermore, a variation of scanning nanotip microscopy will be added providing ultrafine spatial resolution. In combination, this will allow to visualize charge motion and electric fields in microelectronic devices in real-time at with unprecedented space-time resolution. This investigation will critically expand our fundamental knowledge of electron transport at extremely high frequencies, which is necessary for designing future microelectronic devices. Furthermore, it will introduce a disruptive diagnostic solution for industry to see their current and future prototypes while in operation, in order to guide future micro- and nano-electronics towards faster frequency regimes than current technology allows.

Оригинален текст от CORDIS (на английски).

Участници

UNIVERSITAT KONSTANZ · KonstanzКоординаторГермания